ВходНаше всё Теги codebook 无线电组件 Поиск Опросы Закон Суббота
20 июля
1337425 Топик полностью
=L.A.= (06.08.2023 21:03, просмотров: 112) ответил Alex68 на вот нашел грязную-грязную фотошку сабжа. а то всё думают, шо у меня трава несвежая.
Dual Pseudo Differential 16-Bit, 1 MSPS PulSAR ADC 12.0 mW in QSOP 

https://www.jotrin.com/product/parts/AD79023BSZ


The AD79023BSZ is a dual 16-bit, successive approximation, analog-to-digital converter (ADC) that operates from a single power supply, VDDx, per ADC. It contains two low power, high speed, 16-bit sampling ADCs and a versatile serial port interface (SPI). On the CNVx rising edge, the AD79023BSZ samples an analog input, IN+ in the range of 0 V to VREF with respect to a ground sense, IN−. The externally applied reference voltage of the REFx pins (VREF) can be set independently from the supply voltage pins, VDDx. The power of the device scales linearly with throughput.

Using the SDIx inputs, the SPI-compatible serial interface can also daisy-chain multiple ADCs on a single 3-wire bus and provide an optional busy indicator. It is compatible with 1.8 V, 2.5 V, 3 V, or 5 V logic, using the separate VIOx supplies.

The AD79023BSZ is available in a 20-lead QSOP package with operation specified from −40°C to +125°C.

Feature

16-bit resolution with no missing codes

Throughput: 1 MSPS

Lowpower dissipation7.0 mW at 1 MSPS (VDD1 and VDD2 only) 12.0 mW at 1 MSPS (total)140 µW at 10 kSPS

INL: ±1.0 LSB typical, ±2.5 LSB maximum

Pseudodifferential analog input range0 V to VREF with VREF between 2.4 V to 5.1 VAllows use of any input rangeEasy to drive with the ADA4841-1/ADA4841-2

SINAD: 91 dB at 1 kHz

THD: −105 dB at 1 kHz

No pipeline delay

Single-supply 2.5 V operation with 1.8 V/2.5 V/3 V/5 V logic interface

Serial port interface (SPI) QSPI/MICROWIRE/DSP compatible

20-lead QSOP package

Wide operating temperature range: −40°C to +125°C

Applications

Battery-powered equipment

Communications

Automated test equipment (ATE)

Data acquisition

Medical instrumentation

Redundant measurement

Simultaneous sampling