Моя конференция

АТТ-2592: Тест-драйв электромагнитной обстановки в вашем офисе

Портативный измеритель уровня электромагнитного фона АКТАКОМ АТТ-2592 предназначен для безопасного измерения характеристик электромагнитного фона поля изотропным методом. Прибор снабжен 3-канальным датчиком позволяющим проводить измерения одновременно по трем осям: X Y… 06-07-2026

Ручной механический фазовращатель от Talent Microwave

Компания Suzhou Talent Microwave представляет ручной пассивный фазовращатель предназначенный для прецизионного управления фазой сигнала в диапазоне частот до 8 ГГц и диапазоном фазового сдвига от 0 до 180 /ГГц TLMPS-8G-180-S. 06-07-2026

Обработка заказов

Уважаемые клиенты По техническим причинам обработка заказов занимает больше времени. Приносим свои извинения за доставленные неудобства. 02-07-2026

АТК-2001 в наличии: малогабаритные токовые клещи с True RMS и возможностью подключения милливольтовых адаптеров

Расширенная партия профессиональных токоизмерительных клещей АКТАКОМ АТК-2001 готова к отгрузке. Прибор сочетает в себе функции высокочувствительного миллиамперметра постоянный ток от 1 мА переменный от 0 1 мА и вольтметра до 400 В. Это решение для сервисных инженеров работающих с импульсными блоками питания системами автоматики и электротранспортом. 02-07-2026

Микроконтроллеры реального времени для цифровой энергетики промышленной автоматики и автомобильной электроники от NOVOSENSE

Компания NOVOSENSE предлагает серию микроконтроллеров реального времени… 01-07-2026

Портативный калибратор АМ-7025 по привлекательной цене

Информируем о снижении цены на портативный калибратор процессов АКТАКОМ АМ-7025. Прибор обладает расширенным функционалом обеспечивая одновременное измерение и воспроизведение сигналов поддержку калибровки датчиков с питанием от петли тока 24 В а также автоматическое пошаговое и пандусное тестирование. 30-06-2026

DC/DC-преобразователи Voltbricks по сниженным ценам: складские позиции и быстрые поставки

Теллур Электроникс сообщает о снижении цен на популярные линейки DC/DC-преобразователей Voltbricks . В акции участвуют модульные преобразователи напряжения для вычислительной техники телекоммуникационного оборудования промышленной автоматики железнодорожной техники и шкафных систем питания. Продукция компании Voltbricks известна на рынке надёжностью долговечностью и широким спектром модульных 29-06-2026

Кризис рынка памяти: уход MLC NAND взлет цен и новые решения для промышленности

Июнь 2026 года стал поворотным моментом для глобального рынка полупроводниковой памяти. 29-06-2026

Why the NES Put Out a Wobbly Picture

The NTSC television standard is a masterpiece of mid-century engineering to pack a color image into the transmission bandwidth of a monochrome one and to do so while maintaining backward read… 07-07-2026

Neural implant merges photovoltaics with custom analog PPM encoding

Good and useful things can come in truly tiny packages when there are tightly focused design objectives. The post Neural implant merges photovoltaics with custom analog PPM encoding appeared first on… 07-07-2026

Plasma Process Makes Graphene Oxide Directly

An unexpected laboratory finding has revealed a way to produce a key nanomaterial generating a valuable industrial output at the same time. Researchers at Texas A M University have developed a new method for producing graphene oxide directly from methane using a nonthermal plasma water interface. Reported in Nature Communications the process converts natural… 07-07-2026

New Method Improves Semiconductor Insulator Lifetime Estimates

Researchers have developed a statistical method that could improve the prediction of semiconductor insulator lifetimes and overcome limitations in conventional reliability testing. Researchers from TU Wien in collaboration with IBM and the National University of Singapore teams have developed a new statistical approach that could improve the estimation of the lifetimes of insulation materials… 07-07-2026

Photoluminescence Inspection Is Changing How Manufacturers Protect Yield In SiC And GaN Devices

Detecting subsurface or crystalline defects that directly impact electrical behavior in wide-bandgap materials. The post Photoluminescence Inspection Is Changing How Manufacturers Protect Yield In SiC And GaN Devices appeared first on Semiconductor Engineering… 07-07-2026

From Data Accumulation To Data Activation: AI-Driven Data Feed Forward For Chiplet-Based Test

Why the move to advanced packaging is reshaping how the industry collects moves and acts on test data and how Data Feed Forward turns upstream measurements into downstream intelligence. The post From Data Accumulation To Data Activation: AI-Driven Data Feed Forward For Chiplet-Based Test appeared first on Semiconductor Engineering… 07-07-2026

The Test Cell Ecosystem: From Tester Performance To Production Outcomes

Why integration and cross-domain coordination now define test outcomes. The post The Test Cell Ecosystem: From Tester Performance To Production Outcomes appeared first on Semiconductor Engineering… 07-07-2026

Multi-die Testing In The Field Must Build On Established Test Methodologies

Having a device that works at time zero is no longer a guarantee of reliability over its lifetime. The post Multi-die Testing In The Field Must Build On Established Test Methodologies appeared first on Semiconductor Engineering… 07-07-2026

Inspection And Metrology Catching Up For High-Density Fan-Out Panel Packaging

Optical methods need to comply with increasing warpage finer RDL pitch and trace size. The post Inspection And Metrology Catching Up For High-Density Fan-Out Panel Packaging appeared first on Semiconductor Engineering… 07-07-2026

From Reactive Replacement To Predictive Planning: Unlocking Probe Card Intelligence With Real-Time Data

DC profiling based analytics could reduce downtime protect yield and improve operational stability across wafer test environments. The post From Reactive Replacement To Predictive Planning: Unlocking Probe Card Intelligence With Real-Time Data appeared first on Semiconductor Engineering… 07-07-2026

When The Test Cell Lies

As margins shrink and dies move into expensive packages separating device failures from test-cell artifacts has become a first-order economic problem. The post When The Test Cell Lies appeared first on Semiconductor Engineering… 07-07-2026

Unlocking Scalable SRG Waveguides for Mass-Market AR/MR Displays

An approach for full process control for the HVM of SRG waveguides encompassing metal film metrology OCD measurements of grating parameters overlay alignment verification and defect inspection. The post Unlocking Scalable SRG Waveguides for Mass Market AR/MR Displays appeared first on Semiconductor Engineering… 07-07-2026

eSIM Evolves from Subscriber Identity to Device Trust

eSIM turns SIMs into device trust anchors for IoT cars and AI letting fleets switch networks and stay secure remotely. The post eSIM Evolves from Subscriber Identity to Device Trust appeared first on EE Times… 07-07-2026

Memory wall: Why cache miss tolerance defines CPU performance now

Here are six memory wall insights gained from evaluating the FlatBuffers workload on a RISC-V processor. The post Memory wall: Why cache miss tolerance defines CPU performance now appeared first on… 07-07-2026

Certified 3D Ultrasonic Sensor Improves Robot Safety

The safety-certified 3D ultrasonic sensor provides an independent safety layer to help robots detect people and obstacles while reducing blind spots. Sonair a Norwegian robotics firm has recently unveiled the ADAR One claiming that it is the world s first safety-certified 3D ultrasonic sensor for human-robot collaborations. The sensor targets Autonomous Mobile Robots AMRs humanoids… 07-07-2026

Single Chip Brings Brain-Like Computing Closer

Researchers have created an oxide-based electronic device that combines processing and memory in one chip paving the way for faster low-power neuromorphic computing systems. Researchers from the Federal University of S o Carlos UFSCar in Brazil working with international collaborators have developed an oxide-based electronic device that combines data processing and memory within a single… 07-07-2026